By Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
The luck of the Springer sequence utilized Scanning Probe tools I–VII and the speedily increasing actions in scanning probe improvement and functions world wide made it a average step to gather additional speci c ends up in the elds of improvement of scanning probe microscopy thoughts (Vol. VIII), characterization (Vol. IX), and biomimetics and business functions (Vol. X). those 3 volumes supplement the former set of volumes lower than the topic themes and provides perception into the new paintings of prime experts of their respective elds. Following the culture of the sequence, the chapters are prepared round options, characterization and biomimetics and commercial purposes. quantity VIII specializes in novel scanning probe ideas and the knowledge of tip/sample interactions. issues comprise close to eld imaging, complex AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever structures, mixtures of AFM sensors and scanning electron and ion microscopes, calibration equipment, frequency modulation AFM for software in drinks, Kelvin probe strength microscopy, scanning capacitance microscopy, and the size of electric shipping houses on the nanometer scale. Vol. IX makes a speciality of characterization of fabric surfaces together with structural in addition to neighborhood mechanical characterization, and molecular platforms. the quantity covers a extensive spectrum of STM/AFM investigations together with fullerene layers, strength spectroscopy for probing fabric houses as a rule, organic lms .and cells, epithelial and endothelial layers, clinical comparable platforms similar to amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical homes ofpolymernanostructures, technical polymers, and close to eld optics.
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Additional resources for Applied scanning probe methods X: biomimetics and industrial applications
23 Low-Noise Methods for Optical Measurements of Cantilever Deflections Tilman E. Schäffer . . . . . . . . . . . . . . 51 Q-controlled Dynamic Force Microscopy in Air and Liquids Hendrik H¨olscher, Daniel Ebeling, Udo D. Schwarz . . . . 75 High-Frequency Dynamic Force Microscopy Hideki Kawakatsu . . . . . . . . . . . . . . 99 Torsional Resonance Microscopy and Its Applications Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan . . . 113 Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Yaxin Song, Bharat Bhushan .
105 Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography Marta Tello, Fernando García, Ricardo García . . . . . . 137 Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM) Chen Wang, Chunli Bai . . . . . . . . . . . . 159 Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection Hans Peter Lang, Martin Hegner, Christoph Gerber . . . . 183 Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices B.
389 Super Density Optical Data Storage by Near-Field Optics Jun Tominaga . . . . . . . . . . . . . . . 429 Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM) Ryoichi Yamamoto . . . . . . . . . . . . . . 439 Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process Kazuhiko Matsumoto . . . . . . . . . . . . . 459 Subject Index . . . . . . . . . . . . . . . . . . 469 14 15 16 Contents – Volume II 1 2 3 4 5 Higher Harmonics in Dynamic Atomic Force Microscopy Robert W.