By Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
Electromagnetic Compatibility of built-in Circuits: innovations for Low Emission and Susceptibility focuses on the electromagnetic compatibility of built-in circuits. the fundamental innovations, thought, and an in depth historic assessment of built-in circuit emission and susceptibility are supplied. Standardized size tools are distinctive via numerous case reviews. EMC types for the center, I/Os, offer community, and packaging are defined with purposes to carried out switching noise, sign integrity, near-field and radiated noise. Case stories from diversified businesses and study laboratories are provided with in-depth descriptions of the ICs, try set-ups, and comparisons among measurements and simulations. particular directions for attaining low emission and susceptibility derived from the adventure of EMC specialists are provided.
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Additional info for Electromagnetic compatibility of integrated circuits : techniques for low emission and susceptibility
B -;1 0 . 100 Frequency[MHz] 50 300 Figure 2-15. Impact of on-chip and off-chip decoupling capacitance on radiated emissions. 32 Historical Review and State-of-the-Art IC location -7 X axis Figure 2-16. Near-field scanning. Several works were published soon after (Steinecke, 2000; Van Wershoven, 2000) that confirmed that implementing large embedded capacitors, with values from 1 to 50 nF depending on the technologies and the size of the die, was a very efficient way of reducing emissions. Slattery also used the TEM cell (1999) to compare the emission characteristics of several microprocessors.
3-9): In these equations, the m parameter characterizes the magnetic moment expressed in terms of product between the current I and the loop surfacedy (Eq. 3-10): In Eq. (3-8) and Eq. (3-91, the quasi-static approximation of the magnetic field can be recognized.
Slattery (1999) also designed and built one of the first near-field measurement scanners with a resolution high enough to map the fields above integrated circuit packages (Fig. 2-16). Many research labs involved in the study of chip-level EMC are now using near-field scanners based on the Slattery design. Integrated circuit suppliers in Japan are world leaders in the production of low emission processors, in particular for automotive applications. Therefore, it is not surprising to find Japanese authors in scientific publications on the subject.