By Yangyang Yu, Barry W. Johnson (auth.), Alfredo Benso, Paolo Prinetto (eds.)
Fault Injection ideas and instruments for Embedded structures Reliability Evaluation intends to be a finished consultant to Fault Injection options used to judge the dependability of a electronic procedure. the outline and the serious research of other Fault Injection thoughts and instruments should be authored by means of key scientists within the box of method dependability and fault tolerance.
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Extra resources for Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
2. High level of device integration, multiple-chip hybrid circuit, and dense packaging technologies limit accessibility to injection. 3. Some hardware fault injection methods, such as the state mutation, require stopping and restarting the processor to inject a fault, it is not always effective for measuring latencies in the physical systems. 4. Low portability. 5. Limited set of injection points and limited set of injectable faults. 6. the setup time for each experiment might offset the time gained by being able to performed the experiments in near real-time.
Even if the no-response faults can be eliminated using some sort of algorithmic processing to constrain the fault space, the number of fault injection experiments needed to estimate the Coverage with a reasonable confidence interval can still be extremely large. For instance, a rough rule of thumb is that a coverage estimate of with a reasonable confidence interval (for example, 90%), requires performing approximately fault injection experiments. One can see how this could quickly become a huge liability, given that there will more than likely be limited time and resources to devote to performing the fault injection experiments.
Alternatively to analysis‚ dependability evaluation by measurement can be applied. ‚ high safety targets. This leads to fault injection as evaluation measure. But to obtain credible measurements from fault injection several requirements must be carefully considered and solved. 2 - DEPENDABILITY EVALUATION METHODS dependability evaluation as complement to other measures‚ but finding “Common Criteria” for this approach is left as important task for future. e. bit-flip in memories or in sequential elements.