By Luohan Peng, Huiliang Zhang, Philip Hemmer, Hong Liang (auth.), Bharat Bhushan (eds.)
This booklet provides the actual and technical origin of the state-of-the-art in utilized scanning probe innovations. It constitutes a well timed and accomplished review of SPM purposes. The chapters during this quantity relate to scanning probe microscopy recommendations, characterization of varied fabrics and constructions and common business functions, together with topographic and dynamical floor reports of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. The chapters are written by way of best researchers and alertness scientists from around the globe and from numerous industries to supply a broader perspective.
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Extra resources for Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
73(23), 3360–3362 (1998) 7. D. B. J. Sibener, Hierarchical assembly and compliance of aligned nanoscale polymer cylinders in confinement. Langmuir 20(12), 5091–5099 (2004) 8. A. J. Bronikowski, A. Gallagher, Chemical vapor deposition of nanometer-size aluminum features on silicon surfaces using an STM tip. Appl. Surf. Sci. 107, 11–17 (1996) 9. G. F. Quate, C. Gerber, Atomic force microscope. Phys. Rev. Lett. 56(9), 930 (1986) 10. G. Binnig, H. Rohrer, Scanning tunneling microscopy. IBM J. Res. Dev.
Physica Status Solidi (a) 145(2), 333–338 (1994) 30. M. , Pulsed laser-assisted surface structuring with optical near-field enhanced effects. J. Appl. Phys. 92(5), 2495–2500 (2002) 31. M. Tortonese, Cantilevers and tips for atomic force microscopy. Eng. Med. Biol. , IEEE 16(2), 28–33 (1997) 32. B. Bhushan, Scanning probe Microscopy in Nanoscience and Nanotechnology, vol 14. Nanoscience and Technology (Springer, Berlin, 2010) Chapter 2 Characterization and Optimization of Quartz Tuning Fork-Based Force Sensors for Combined STM/AFM Andres Castellanos-Gomez, Nicolás Agraït, and Gabino Rubio-Bollinger Abstract This chapter will be divided in two main parts.
1007/978-3-642-25414-7__2, © Springer-Verlag Berlin Heidelberg 2013 23 24 A. Castellanos-Gomez et al. Fig. 1 Quartz tuning fork-based force sensor. An optical micrograph of the attached tip is shown at the right to operate atomic force microscopes based on these sensors . In this operation scheme, the tuning fork is excited at its resonance frequency by means of a phaselocked loop (PLL) while the resonance frequency shift is measured. This frequency shift is related to the force gradient acting between tip (Fig.